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SEM Analysis

750.00

Scanning Electron Microscopy (SEM) provides high-resolution and long-depth-of-field images of the sample surface and near-surface.

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Description

Scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons.

1) Specification: Equipment provides a good clear images upto magnification 3500x. Around 3 images per sample will be provided.

2) Sample: Solid as well as Liquid samples can be tested.

3) Quantity: Solid 50 mg or Liquid 0.5 ml

4) Time required (Tentative): 15 days

Equipment Details

SEM (Scanning Electron Microscopy)
Equipment Make: / Model: JEOL 5400 / Make: Japan
Coating: Gold ion Coating for 5-6 mins

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