SEM Analysis

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Scanning Electron Microscopy (SEM) provides high-resolution and long-depth-of-field images of the sample surface and near-surface. SEM is one of the most widely used analytical tools due to the extremely detailed images it can quickly provide. Coupled to an auxiliary Energy Dispersive X-ray Spectroscopy (EDS) detector, SEM also offers elemental identification of nearly the entire periodic table.
Scanning electron microscope

Scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons.

1) Specification: Equipment provides a good clear images upto magnification 3500x. Around 3 images per sample will be provided.

2) Sample: Solid as well as Liquid samples can be tested.

3) Quantity: Solid 50 mg or Liquid 0.5 ml

4) Time required (Tentative): 15 days

Equipment Details
SEM (Scanning Electron Microscopy)
Equipment Make: / Model: JEOL 5400 / Make: Japan
Coating: Gold ion Coating for 5-6 mins

  • High resolution images
  • Elemental microanalysis and particle characterization
  • Aerospace
  • Automotive
  • Biomedical/biotechnology
  • Compound Semiconductor
  • Data Storage
  • Defense
  • Displays
  • Electronics
  • Industrial Products
  • Lighting
  • Pharmaceutical
  • Photonics
  • Polymer
  • Semiconductor
  • Solar Photovoltaics
  • Telecommunications

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